A single-photon avalanche diode test chip in 150nm CMOS technology
Title: | A single-photon avalanche diode test chip in 150nm CMOS technology |
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Authors: | Pancheri, Lucio, Dalla Betta, Gian-Franco, Campos Braga, Leo Huf, Xu, Hesong, Stoppa, David |
Source: | 2014 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2014 International Conference on. :161-164 Mar, 2014 |
Relation: | 2014 International Conference on Microelectronic Test Structures (ICMTS) |
Database: | IEEE Xplore Digital Library |
ISBN: | 9781479921935 9781479921928 |
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ISSN: | 10719032 21581029 |
DOI: | 10.1109/ICMTS.2014.6841486 |
Published in: | 2014 International Conference on Microelectronic Test Structures (ICMTS), Microelectronic Test Structures (ICMTS), 2014 International Conference on |