A single-photon avalanche diode test chip in 150nm CMOS technology

Bibliographic Details
Title: A single-photon avalanche diode test chip in 150nm CMOS technology
Authors: Pancheri, Lucio, Dalla Betta, Gian-Franco, Campos Braga, Leo Huf, Xu, Hesong, Stoppa, David
Source: 2014 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2014 International Conference on. :161-164 Mar, 2014
Relation: 2014 International Conference on Microelectronic Test Structures (ICMTS)
Database: IEEE Xplore Digital Library