Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoSTM/3D ICs
| Title: | Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoSTM/3D ICs |
|---|---|
| Authors: | Goel, Sandeep Kumar, Min-Jer-Wang, Adham, Saman, Mehta, Ashok, Lee, Frank |
| Source: | Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on. :1-4 Apr, 2014 |
| Relation: | 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9781479927760 |
|---|---|
| DOI: | 10.1109/VLSI-DAT.2014.6834918 |
| Published in: | Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on |