Bibliographic Details
| Title: |
A novel DFT architecture for 3DIC test, diagnosis and repair |
| Authors: |
Lee, Mincent, Adham, Saman, Wang, Min-Jer, Peng, Ching-Nen, Lin, Hung-Chih, Hsu, Sen-Kuei, Chen, Hao |
| Source: |
Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on. :1-4 Apr, 2014 |
| Relation: |
2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) |
| Database: |
IEEE Xplore Digital Library |
