Effect of Fringing Capacitances on the RF Performance of GaN HEMTs With T-Gates

Bibliographic Details
Title: Effect of Fringing Capacitances on the RF Performance of GaN HEMTs With T-Gates
Authors: Song, B., Sensale-Rodriguez, B., Wang, R., Guo, J., Hu, Z., Yue, Y., Faria, F., Schuette, M., Ketterson, A., Beam, E., Saunier, P., Gao, X., Guo, S., Fay, P., Jena, D., Xing, H. G.
Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(3):747-754 Mar, 2014
Database: IEEE Xplore Digital Library