Damage control with cluster ion implantation

Bibliographic Details
Title: Damage control with cluster ion implantation
Authors: Sakai, Shigeki, Hamamoto, Nariaki, Nakashima, Yoshiki, Onoda, Hiroshi
Source: 2013 13th International Workshop on Junction Technology (IWJT) Junction Technology (IWJT), 2013 13th International Workshop on. :26-29 Jun, 2013
Relation: 2013 13th International Workshop on Junction Technology (IWJT)
Database: IEEE Xplore Digital Library