Resistance instabilities in a filament-based resistive memory

Bibliographic Details
Title: Resistance instabilities in a filament-based resistive memory
Authors: Chen, Frederick T., Lee, Heng-Yuan, Chen, Yu-Sheng, Rahaman, Shakh Ziaur, Tsai, Chen-Han, Tsai, Kan-Hsueh, Wu, Tai-Yuan, Chen, Wei-Su, Gu, Pei-Yi, Lin, Yu-De, Sheu, Shyh-Shyuan, Tsai, Ming-Jinn, Lee, Li-Heng, Ku, Tzu-Kun, Chen, Pang-Shiu
Source: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :5E.1.1-5E.1.7 Apr, 2013
Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)
Database: IEEE Xplore Digital Library
More Details
ISBN:9781479901111
9781479901128
9781479901135
ISSN:15417026
19381891
DOI:10.1109/IRPS.2013.6532040
Published in:2013 IEEE International Reliability Physics Symposium (IRPS), Reliability Physics Symposium (IRPS), 2013 IEEE International