Simulation of LF noises FET in the program «Micro-Cap» in THE «Transient analysis» mode
| Title: | Simulation of LF noises FET in the program «Micro-Cap» in THE «Transient analysis» mode |
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| Authors: | Malyshev, V.M. |
| Source: | 2012 International Conference on Actual Problems of Electron Devices Engineering Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on. :46-50 Sep, 2012 |
| Relation: | 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9781467320962 9781467320955 9781467320979 |
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| DOI: | 10.1109/APEDE.2012.6478011 |
| Published in: | 2012 International Conference on Actual Problems of Electron Devices Engineering, Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on |