Assessment of fully-depleted planar CMOS for low power complex circuit operation

Bibliographic Details
Title: Assessment of fully-depleted planar CMOS for low power complex circuit operation
Authors: Ren, Z., Mehta, S., Cai, J., Wu, S., Zhu, Y., Kanarsky, T., Kanakasabapathy, S., Edge, L.F., Zhang, R., Lindo, P., Koshy, J., Tabakman, K., Kulkarni, P., Sardesai, V., Cheng, K., Khakifirooz, A., Doris, B., Bu, H., Park, D.-G.
Source: 2011 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2011 IEEE International. :15.5.1-15.5.4 Dec, 2011
Relation: 2011 IEEE International Electron Devices Meeting (IEDM)
Database: IEEE Xplore Digital Library
More Details
ISBN:9781457705045
9781457705069
9781457705052
ISSN:01631918
2156017X
DOI:10.1109/IEDM.2011.6131560
Published in:2011 International Electron Devices Meeting, Electron Devices Meeting (IEDM), 2011 IEEE International