Assessment of fully-depleted planar CMOS for low power complex circuit operation
Title: | Assessment of fully-depleted planar CMOS for low power complex circuit operation |
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Authors: | Ren, Z., Mehta, S., Cai, J., Wu, S., Zhu, Y., Kanarsky, T., Kanakasabapathy, S., Edge, L.F., Zhang, R., Lindo, P., Koshy, J., Tabakman, K., Kulkarni, P., Sardesai, V., Cheng, K., Khakifirooz, A., Doris, B., Bu, H., Park, D.-G. |
Source: | 2011 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2011 IEEE International. :15.5.1-15.5.4 Dec, 2011 |
Relation: | 2011 IEEE International Electron Devices Meeting (IEDM) |
Database: | IEEE Xplore Digital Library |
ISBN: | 9781457705045 9781457705069 9781457705052 |
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ISSN: | 01631918 2156017X |
DOI: | 10.1109/IEDM.2011.6131560 |
Published in: | 2011 International Electron Devices Meeting, Electron Devices Meeting (IEDM), 2011 IEEE International |