Analysis and Design of Nanoscale CMOS Storage Elements for Single-Event Hardening With Multiple-Node Upset
| Title: | Analysis and Design of Nanoscale CMOS Storage Elements for Single-Event Hardening With Multiple-Node Upset |
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| Authors: | Lin, S., Kim, Y.-B., Lombardi, F. |
| Source: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 12(1):68-77 Mar, 2012 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2011.2167233 |
| Published in: | IEEE Transactions on Device and Materials Reliability, Device and Materials Reliability, IEEE Transactions on, IEEE Trans. Device Mater. Relib. |