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Failure analysis using LVP for tolerant design about BEOL parasitic effects in nanoscale technology

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Title: Failure analysis using LVP for tolerant design about BEOL parasitic effects in nanoscale technology
Authors: Jung-Tae Kim, Yong-Seop Kim, Moo-Jong Hong, Yun-Woo Lee, Eun-Chul Lee, Gab-Soo Han
Source: 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-5 Jul, 2011
Relation: 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011)
Database: IEEE Xplore Digital Library
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  Data: Failure analysis using LVP for tolerant design about BEOL parasitic effects in nanoscale technology
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  Data: 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-5 Jul, 2011
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  Data: 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011)
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      – Type: doi
        Value: 10.1109/IPFA.2011.5992755
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        PageCount: 5
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      – TitleFull: Failure analysis using LVP for tolerant design about BEOL parasitic effects in nanoscale technology
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      – PersonEntity:
          Name:
            NameFull: Jung-Tae Kim
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          Name:
            NameFull: Yong-Seop Kim
      – PersonEntity:
          Name:
            NameFull: Moo-Jong Hong
      – PersonEntity:
          Name:
            NameFull: Yun-Woo Lee
      – PersonEntity:
          Name:
            NameFull: Eun-Chul Lee
      – PersonEntity:
          Name:
            NameFull: Gab-Soo Han
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      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Type: published
              Y: 2011
          Identifiers:
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              Value: 9781457701597
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              Value: 9781457701580
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          Titles:
            – TitleFull: 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the
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