Failure analysis using LVP for tolerant design about BEOL parasitic effects in nanoscale technology
| Title: | Failure analysis using LVP for tolerant design about BEOL parasitic effects in nanoscale technology |
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| Authors: | Jung-Tae Kim, Yong-Seop Kim, Moo-Jong Hong, Yun-Woo Lee, Eun-Chul Lee, Gab-Soo Han |
| Source: | 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-5 Jul, 2011 |
| Relation: | 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9781457701597 9781457701580 |
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| ISSN: | 19461542 19461550 |
| DOI: | 10.1109/IPFA.2011.5992755 |
| Published in: | 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the |