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Reliability and Life Prediction for electronic connectors for control applications

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Title: Reliability and Life Prediction for electronic connectors for control applications
Authors: Varde, P.V., Agarwal, M., Marathe, P.P., Mohapatra, U., Sharma, R.C., Naikan, V.N.A.
Source: 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on. :63-67 Dec, 2010
Relation: 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH)
Database: IEEE Xplore Digital Library
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        Value: 10.1109/ICRESH.2010.5779634
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        PageCount: 5
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            NameFull: Agarwal, M.
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            – D: 01
              M: 12
              Type: published
              Y: 2010
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