Bibliographic Details
| Title: |
Reliability and Life Prediction for electronic connectors for control applications |
| Authors: |
Varde, P.V., Agarwal, M., Marathe, P.P., Mohapatra, U., Sharma, R.C., Naikan, V.N.A. |
| Source: |
2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on. :63-67 Dec, 2010 |
| Relation: |
2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) |
| Database: |
IEEE Xplore Digital Library |
