Modeling the lifetime of a lateral DMOS transistor in repetitive clamping mode
| Title: | Modeling the lifetime of a lateral DMOS transistor in repetitive clamping mode |
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| Authors: | Riedlberger, E., Keller, R., Reisinger, H., Gustin, W., Spitzer, A., Stecher, M., Jungemann, C. |
| Source: | 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :175-181 May, 2010 |
| Relation: | 2010 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |
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