Modeling the lifetime of a lateral DMOS transistor in repetitive clamping mode
| Title: | Modeling the lifetime of a lateral DMOS transistor in repetitive clamping mode |
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| Authors: | Riedlberger, E., Keller, R., Reisinger, H., Gustin, W., Spitzer, A., Stecher, M., Jungemann, C. |
| Source: | 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :175-181 May, 2010 |
| Relation: | 2010 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9781424454303 9781424454310 9781424454297 |
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| ISSN: | 15417026 19381891 |
| DOI: | 10.1109/IRPS.2010.5488833 |
| Published in: | 2010 IEEE International Reliability Physics Symposium, Reliability Physics Symposium (IRPS), 2010 IEEE International |