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Modeling the lifetime of a lateral DMOS transistor in repetitive clamping mode

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Title: Modeling the lifetime of a lateral DMOS transistor in repetitive clamping mode
Authors: Riedlberger, E., Keller, R., Reisinger, H., Gustin, W., Spitzer, A., Stecher, M., Jungemann, C.
Source: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :175-181 May, 2010
Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)
Database: IEEE Xplore Digital Library
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  Data: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :175-181 May, 2010
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  Data: 2010 IEEE International Reliability Physics Symposium (IRPS)
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        Value: 10.1109/IRPS.2010.5488833
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            NameFull: Keller, R.
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            NameFull: Reisinger, H.
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              M: 05
              Type: published
              Y: 2010
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