Cheng, K., Khakifirooz, A., Kulkarni, P., Ponoth, S., Kuss, J., Shahrjerdi, D., . . . Doris, B. (2009). Extremely thin SOI (ETSOI) CMOS with record low variability for low power system-on-chip applications. 2009 IEEE International Electron Devices Meeting (IEDM), Electron Devices Meeting (IEDM), 2009 IEEE International, 1. https://doi.org/10.1109/IEDM.2009.5424422
Chicago Style (17th ed.) CitationCheng, K., et al. "Extremely Thin SOI (ETSOI) CMOS with Record Low Variability for Low Power System-on-chip Applications." 2009 IEEE International Electron Devices Meeting (IEDM), Electron Devices Meeting (IEDM), 2009 IEEE International 2009: 1. https://doi.org/10.1109/IEDM.2009.5424422.
MLA (8th ed.) CitationCheng, K., et al. "Extremely Thin SOI (ETSOI) CMOS with Record Low Variability for Low Power System-on-chip Applications." 2009 IEEE International Electron Devices Meeting (IEDM), Electron Devices Meeting (IEDM), 2009 IEEE International, 2009, p. 1, https://doi.org/10.1109/IEDM.2009.5424422.
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