Single shot measurement in silicon single electron transistors
| Title: | Single shot measurement in silicon single electron transistors |
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| Authors: | Ferrus, T., Williams, D. A., Hasko, D. G., Creswell, L., Collier, R. J., Lam, A., Morrissey, Q. R., Burge, S. R., French, M. J., Briggs, G. A. D. |
| Source: | 2008 IEEE Silicon Nanoelectronics Workshop Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE. :1-2 Jun, 2008 |
| Relation: | 2008 IEEE Silicon Nanoelectronics Workshop (SNW) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9781424420711 |
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| ISSN: | 21614636 21614644 |
| DOI: | 10.1109/SNW.2008.5418454 |
| Published in: | 2008 IEEE Silicon Nanoelectronics Workshop, Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE |