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Estimation of Trap Density in AlGaN/GaN HEMTs from Subthreshold Slope Study

Bibliographic Details
Title: Estimation of Trap Density in AlGaN/GaN HEMTs from Subthreshold Slope Study
Authors: Chung, J. W., Zhao, X., Palacios, T.
Source: 2007 65th Annual Device Research Conference Device Research Conference, 2007 65th Annual. :111-112 Jun, 2007
Relation: 2007 65th Annual Device Research Conference
Database: IEEE Xplore Digital Library
More Details
ISBN:9781424411016
9781424411023
ISSN:15483770
DOI:10.1109/DRC.2007.4373674
Published in:2007 65th Annual Device Research Conference, Device Research Conference, 2007 65th Annual