Enabling Effective Yield Learning through Actual DFM-Closure at the SoC Level
| Title: | Enabling Effective Yield Learning through Actual DFM-Closure at the SoC Level |
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| Authors: | Appello, D., Tancorre, V., Green, G., Hay, C., Gizdarski, E. |
| Source: | 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference Advanced Semiconductor Manufacturing Conference, 2007. ASMC 2007. IEEE/SEMI. :148-152 Jun, 2007 |
| Relation: | 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 1424406528 9781424406524 1424406536 9781424406531 |
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| ISSN: | 10788743 23766697 |
| DOI: | 10.1109/ASMC.2007.375103 |
| Published in: | 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, Advanced Semiconductor Manufacturing Conference, 2007. ASMC 2007. IEEE/SEMI |