Characterization of industrial p-type CZ silicon wafers passivated with a-SiC/sub x/:H films

Bibliographic Details
Title: Characterization of industrial p-type CZ silicon wafers passivated with a-SiC/sub x/:H films
Authors: Vetter, M., Touati, Y., Martin, I., Ferre, R., Alcubilla, R., Torres, I., Alonso, J., Vazquez, M.A.
Source: Conference on Electron Devices, 2005 Spanish Electron devices Electron Devices, 2005 Spanish Conference on. :247-250 2005
Relation: 2005 Spanish Conference on Electron Devices. Proceedings
Database: IEEE Xplore Digital Library
More Details
ISBN:0780388100
9780780388109
ISSN:21634971
DOI:10.1109/SCED.2005.1504370
Published in:Conference on Electron Devices, 2005 Spanish, Electron Devices, 2005 Spanish Conference on, Electron devices