Bibliographic Details
| Title: |
Point defects in lithium fluoride by EUV and soft X-rays exposure for X-ray microscopy and optical applications |
| Authors: |
Baldacchini, G., Bollanti, S., Bonfigli, F., Di Lazzaro, P., Faenov, A.Ya., Flora, F., Marolo, T., Montereali, R.M., Murra, D., Nichelatti, E., Pikuz, T., Reale, A., Reale, L., Ritucci, A., Tomassetti, G. |
| Source: |
IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 10(6):1435-1445 Jan, 2004 |
| Database: |
IEEE Xplore Digital Library |
