Bibliographic Details
| Title: |
A digital and wide power bandwidth H-field generator for automatic test equipment |
| Authors: |
Fengming Zhang, Lee, Y.J., Kane, T., Schiano, L., Momenzadeh, M., Kim, Y.-B., Meyer, F.J., Lombardi, F., Max, S., Perkinson, P. |
| Source: |
Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on. :159-166 2003 |
| Relation: |
Proceedings. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Database: |
IEEE Xplore Digital Library |
