Predictive Model for Diabetic Re-admission Using Neural Network Techniques

Bibliographic Details
Title: Predictive Model for Diabetic Re-admission Using Neural Network Techniques
Authors: Abirami, T., Jayadharshini, P., Madhuvarshini, K., Kavin, P., Gokulraj, K.
Source: 2024 IEEE 4th International Conference on ICT in Business Industry & Government (ICTBIG) ICT in Business Industry & Government (ICTBIG), 2024 IEEE 4th International Conference on. :1-6 Dec, 2024
Relation: 2024 IEEE 4th International Conference on ICT in Business Industry & Government (ICTBIG)
Database: IEEE Xplore Digital Library