Link, L. S., Mohamed, M. F. P., & Lik, T. C. (2024). Effect of Fluorine Implant Energy on the Performance of P+/N-Junction, Poly-Si Resistor, and PMOS. 2024 IEEE 40th International Electronics Manufacturing Technology (IEMT), Electronics Manufacturing Technology (IEMT),2024 IEEE 40th International, 1-4. https://doi.org/10.1109/IEMT61324.2024.10875202
Chicago Style (17th ed.) CitationLink, Lee Sai, Mohamed Fauzi Packeer Mohamed, and Tan Chan Lik. "Effect of Fluorine Implant Energy on the Performance of P+/N-Junction, Poly-Si Resistor, and PMOS." 2024 IEEE 40th International Electronics Manufacturing Technology (IEMT), Electronics Manufacturing Technology (IEMT),2024 IEEE 40th International 2024: 1-4. https://doi.org/10.1109/IEMT61324.2024.10875202.
MLA (8th ed.) CitationLink, Lee Sai, et al. "Effect of Fluorine Implant Energy on the Performance of P+/N-Junction, Poly-Si Resistor, and PMOS." 2024 IEEE 40th International Electronics Manufacturing Technology (IEMT), Electronics Manufacturing Technology (IEMT),2024 IEEE 40th International, 2024, pp. 1-4, https://doi.org/10.1109/IEMT61324.2024.10875202.
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