Bibliographic Details
| Title: |
Filament-Free Bulk RRAM with High Endurance and Long Retention for Neuromorphic Few-Shot Learning On-Chip |
| Authors: |
Kumar, Ashwani, Zhou, Yucheng, Potladurthy, Sai Praneeth, Kim, Jeong-Hoon, Xu, Weihong, Ponzina, Flavio, Kim, Seonghyun, Cubukcu, Ertugrul, Rosing, Tajana, Cauwenberghs, Gert, Kuzum, Duygu |
| Source: |
2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024 |
| Relation: |
2024 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |
