Kumar, V., Kumar Sharma, D., Dasgupta, S., & Datta, A. (2025). Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET. IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices, 72(3), 1293-1300. https://doi.org/10.1109/TED.2025.3535680

Kumar, V., D. Kumar Sharma, S. Dasgupta, and A. Datta. "Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET." IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices 72, no. 3 (2025): 1293-1300. https://doi.org/10.1109/TED.2025.3535680.

Kumar, V., et al. "Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET." IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices, vol. 72, no. 3, 2025, pp. 1293-1300, https://doi.org/10.1109/TED.2025.3535680.