Reliability-Enhanced Reverse Forming Operation Scheme for Analog Resistive Random-Access Memory
| Title: | Reliability-Enhanced Reverse Forming Operation Scheme for Analog Resistive Random-Access Memory |
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| Authors: | Jiang, Z., Xi, Y., Lu, Y., Tang, J., Hu, R., Du, Y., Gao, B., Qian, H., Wu, H. |
| Source: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 46(2):199-202 Feb, 2025 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2024.3521924 |
| Published in: | IEEE Electron Device Letters, Electron Device Letters, IEEE, IEEE Electron Device Lett. |