Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes
| Title: | Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes |
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| Authors: | Soldatov, I., Ozer, B., Aswartham, S., Selter, S., Veyrat, L., Buchner, B., Schafer, R. |
| Source: | IEEE Access Access, IEEE. 12:181025-181040 2024 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 21693536 |
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| DOI: | 10.1109/ACCESS.2024.3509030 |
| Published in: | IEEE Access, Access, IEEE |