250 MHz to 1.1 THz measurement of an InP-HEMT using on-wafer multiline Thru-Reflect-Line calibration
| Title: | 250 MHz to 1.1 THz measurement of an InP-HEMT using on-wafer multiline Thru-Reflect-Line calibration |
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| Authors: | Younes, R., Samnouni, M., Lepilliet, S., Wichmann, N., Ducournau, G., Bollaert, S. |
| Source: | 2024 54th European Microwave Conference (EuMC) European Microwave Conference (EuMC), 2024 54th. :824-827 Sep, 2024 |
| Relation: | 2024 54th European Microwave Conference (EuMC) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9782874870774 |
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| DOI: | 10.23919/EuMC61614.2024.10732877 |
| Published in: | 2024 54th European Microwave Conference (EuMC), European Microwave Conference (EuMC), 2024 54th |