Characterization of Passivation Layer Losses Using on-chip Chalcogenide Glass Resonators with Ultra-High Q-Factor in the Mid-Infrared Region

Bibliographic Details
Title: Characterization of Passivation Layer Losses Using on-chip Chalcogenide Glass Resonators with Ultra-High Q-Factor in the Mid-Infrared Region
Authors: Suk, Daewon, Ko, Kiyoung, Kim, Jingyu, Park, Sang-Hee Ko, Wang, Rongping, Choi, Duk-Yong, Lee, Hansuek
Source: 2024 Conference on Lasers and Electro-Optics (CLEO) Lasers and Electro-Optics (CLEO), 2024 Conference on. :1-2 May, 2024
Relation: 2024 Conference on Lasers and Electro-Optics (CLEO)
Database: IEEE Xplore Digital Library