Bibliographic Details
| Title: |
On the Output Conductance Dispersion due to Traps and Self-Heating in Large Bulk, FDSOI and FinFET nMOS Devices |
| Authors: |
Tondelli, L., Scholten, A. J., Asanovski, R., Pijper, R. M. T., Dinh, T. V., Selmi, L. |
| Source: |
2024 IEEE European Solid-State Electronics Research Conference (ESSERC) Solid-State Electronics Research Conference (ESSERC), 2024 IEEE European. :345-348 Sep, 2024 |
| Relation: |
2024 IEEE European Solid-State Electronics Research Conference (ESSERC) |
| Database: |
IEEE Xplore Digital Library |
