Research on Pull-Off Strength Test Method of Cross-Surface SiP Device

Bibliographic Details
Title: Research on Pull-Off Strength Test Method of Cross-Surface SiP Device
Authors: Wang, Shinan, Wan, Yongkang, Meng, Zhichao, Yu, Yongjian
Source: 2024 25th International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2024 25th International Conference on. :1-4 Aug, 2024
Relation: 2024 25th International Conference on Electronic Packaging Technology (ICEPT)
Database: IEEE Xplore Digital Library