The Discharge Uncertainty Caused by the Position of Test Mass
Title: | The Discharge Uncertainty Caused by the Position of Test Mass |
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Authors: | Chen, Bingxue, Hong, Wei, Li, QingQing, Li, Honggang, Chu, Liangyu, Bai, Yanzheng, Zhou, Zebing |
Source: | 2024 IEEE 19th Conference on Industrial Electronics and Applications (ICIEA) Industrial Electronics and Applications (ICIEA), 2024 IEEE 19th Conference on. :1-4 Aug, 2024 |
Relation: | 2024 IEEE 19th Conference on Industrial Electronics and Applications (ICIEA) |
Database: | IEEE Xplore Digital Library |
ISBN: | 9798350360868 |
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ISSN: | 21582297 |
DOI: | 10.1109/ICIEA61579.2024.10665135 |
Published in: | 2024 IEEE 19th Conference on Industrial Electronics and Applications (ICIEA), Industrial Electronics and Applications (ICIEA), 2024 IEEE 19th Conference on |