An Efficient Dynamic Threshold Voltage Detection Scheme for Improving 3-D NAND Flash Reliability
| Title: | An Efficient Dynamic Threshold Voltage Detection Scheme for Improving 3-D NAND Flash Reliability |
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| Authors: | Yin, L., Li, Y., Zhang, X., Zhai, X., Han, G. |
| Source: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(4):529-543 Dec, 2024 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2024.3453329 |
| Published in: | IEEE Transactions on Device and Materials Reliability, Device and Materials Reliability, IEEE Transactions on, IEEE Trans. Device Mater. Relib. |