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Photoresponse, X-ray response and electric fields in silicon carbide with graphene

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Title: Photoresponse, X-ray response and electric fields in silicon carbide with graphene
Authors: Dedic, V., Morzhuk, B., Fridrisek, T., Sanitrak, J., Rejhon, M., Shestopalov, M., Cola, A., Kunc, J.
Source: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024
Relation: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
Database: IEEE Xplore Digital Library
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  Data: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024
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  Data: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
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RecordInfo BibRecord:
  BibEntity:
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      – Type: doi
        Value: 10.1109/NSS/MIC/RTSD57108.2024.10657175
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        PageCount: 1
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      – TitleFull: Photoresponse, X-ray response and electric fields in silicon carbide with graphene
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          Name:
            NameFull: Dedic, V.
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            NameFull: Morzhuk, B.
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            NameFull: Fridrisek, T.
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            NameFull: Sanitrak, J.
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            NameFull: Rejhon, M.
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            NameFull: Shestopalov, M.
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            NameFull: Cola, A.
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            NameFull: Kunc, J.
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            – D: 26
              M: 10
              Type: published
              Y: 2024
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          Titles:
            – TitleFull: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE
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