Bibliographic Details
| Title: |
Optimal Test Scenarios based Regression Suite for Functional Verification Closure of Advanced Digital Designs |
| Authors: |
Vanaraj, Anantharaj Thalaimalai, Marshal, R, Lakshminarayanan, G, Raja Sekar, K |
| Source: |
2024 International Conference on Smart Systems for applications in Electrical Sciences (ICSSES) Smart Systems for applications in Electrical Sciences (ICSSES), 2024 International Conference on. :1-6 May, 2024 |
| Relation: |
2024 International Conference on Smart Systems for applications in Electrical Sciences (ICSSES) |
| Database: |
IEEE Xplore Digital Library |
