Bibliographic Details
| Title: |
A Novel Quantitative Model for Combination Effects of Hydrogen and Process Heat on Peripheral Transistors in 3D-NAND Flash Memory |
| Authors: |
Lee, Dongjin, Lee, Yunjo, Na, Soyeong, Yun, KangOh, Baek, Sungkweon, Lee, Jaeduk, Jang, Jaehoon, Song, Jaihyuk |
| Source: |
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P68.TX-1-P68.TX-5 Apr, 2024 |
| Relation: |
2024 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |
