Restrictive antenna rules limiting PID degradation for MOS transistors with connected MIM-capacitors
| Title: | Restrictive antenna rules limiting PID degradation for MOS transistors with connected MIM-capacitors |
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| Authors: | Martin, Andreas, Pham, Phi-Long, Nielen, Heiko, Feil, Maximilian W. |
| Source: | 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-6 Oct, 2023 |
| Relation: | 2023 IEEE International Integrated Reliability Workshop (IIRW) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9798350327274 |
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| ISSN: | 23748036 |
| DOI: | 10.1109/IIRW59383.2023.10477710 |
| Published in: | 2023 IEEE International Integrated Reliability Workshop (IIRW), Integrated Reliability Workshop (IIRW), 2023 IEEE International |