Bibliographic Details
| Title: |
Examination of Interface Trap Charges on Electrically Doped Tunnel FET in the Presence of High-K Dielectric |
| Authors: |
Chandan, Bandi Venkata, Dharmender, Subbarao, Penjerla Srinivasa, Nigam, Kaushal Kumar |
| Source: |
2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Electronics, Materials Engineering & Nano-Technology (IEMENTech), 2023 7th International Conference on. :1-6 Dec, 2023 |
| Relation: |
2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) |
| Database: |
IEEE Xplore Digital Library |
