Bibliographic Details
| Title: |
High-Endurance MoS2 FeFET with Operating Voltage Fess Than IV for eNVM in Scaled CMOS Technologies |
| Authors: |
Lee, Tsung-En, Chiang, Hung-Li, Chang, Chih-Yu, Su, Yuan-Chun, Chang, Shu-Jui, Wu, Jui-Jen, Lin, Bo-Jiun, Wang, Jer-Fu, Haw, Shu-Chih, Chiu, Shang-Jui, Ching, He-Liang, Lin, Yan-Gu, Yun, Wei-Sheng, Hsu, Chen-Feng, Lee, Hengyuan, Lee, Tung-Ying, Passlack, Matthias, Cheng, Chao-Ching, Chang, Chih-Sheng, Wong, H.-S. Philip, Chang, Wen-Hao, Chang, Meng-Fan, Lin, Yu-Ming, Radu, Iuliana P. |
| Source: |
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023 |
| Relation: |
2023 International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |
