Automated Controller Hardware-In-The-Loop Testbed for EV Charger Resilience Analysis

Bibliographic Details
Title: Automated Controller Hardware-In-The-Loop Testbed for EV Charger Resilience Analysis
Authors: Starke, Michael, Kim, Namwon, Dean, Benjamin, Campbell, Steven, Chinthavali, Madhu
Source: 2023 IEEE Transportation Electrification Conference & Expo (ITEC) Transportation Electrification Conference & Expo (ITEC), 2023 IEEE. :1-6 Jun, 2023
Relation: 2023 IEEE Transportation Electrification Conference & Expo (ITEC)
Database: IEEE Xplore Digital Library