Bibliographic Details
| Title: |
Engineering defects in pristine amorphous chalcogenides for forming-free low voltage selectors |
| Authors: |
Ambrosi, E., Wu, C. H., Lee, H. Y., Hsu, C. F., Lee, C. M., Vaziri, S., Datye, I. M., Chen, Y. Y., Hou, D. H., Chang, P. C., Heh, D. W., Liao, P. J., Lee, T. Y., Chang, M. F., Wong, H.-S. P., Bao, X. Y. |
| Source: |
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :18.7.1-18.7.4 Dec, 2022 |
| Relation: |
2022 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |
