Bibliographic Details
| Title: |
Influence of interface oxidation on the electrical contact properties of C-Cu contact pairs |
| Authors: |
Wang, Qingsong, Gao, Guoqiang, Ni, Ziran, He, Zhijiang, Wang, Hong |
| Source: |
2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) High Voltage Engineering and Applications (ICHVE), 2022 IEEE International Conference on. :1-4 Sep, 2022 |
| Relation: |
2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) |
| Database: |
IEEE Xplore Digital Library |
