3-D Heterogeneous Integration of RRAM-Based Compute-In-Memory: Impact of Integration Parameters on Inference Accuracy

Bibliographic Details
Title: 3-D Heterogeneous Integration of RRAM-Based Compute-In-Memory: Impact of Integration Parameters on Inference Accuracy
Authors: Kaul, A., Luo, Y., Peng, X., Manley, M., Yu, S., Bakir, M.S.
Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(2):485-492 Feb, 2023
Database: IEEE Xplore Digital Library