3-D Heterogeneous Integration of RRAM-Based Compute-In-Memory: Impact of Integration Parameters on Inference Accuracy
Title: | 3-D Heterogeneous Integration of RRAM-Based Compute-In-Memory: Impact of Integration Parameters on Inference Accuracy |
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Authors: | Kaul, A., Luo, Y., Peng, X., Manley, M., Yu, S., Bakir, M.S. |
Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(2):485-492 Feb, 2023 |
Database: | IEEE Xplore Digital Library |
ISSN: | 00189383 15579646 |
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DOI: | 10.1109/TED.2022.3231570 |
Published in: | IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices |