Identifying the Process Shift with Robust Control Charts in the Presence of Contamination

Bibliographic Details
Title: Identifying the Process Shift with Robust Control Charts in the Presence of Contamination
Authors: Wong Chiong Liong, Ng Kooi Huat, Tan Wei Lun
Source: ITM Web of Conferences, Vol 67, p 01027 (2024)
Publisher Information: EDP Sciences, 2024.
Publication Year: 2024
Collection: LCC:Information technology
Subject Terms: Information technology, T58.5-58.64
More Details: Conventional control charts have traditionally been reliable tools for monitoring processes under the assumption of normally distributed data. However, real-world data often deviate from this idealized normality, leading to reduced charting performance and potentially causing process anomalies to go unnoticed. In this study, by integrating robust statistical estimators and innovative charting techniques, robust control charts demonstrate their capability to effectively detect process shifts and abnormalities in a variety of challenging settings. Through Monte Carlo simulation studies and a real dataset application, this research provides insights into the benefits and limitations of robust control charts. Our findings indicate that the proposed robust control charts show a notable performance in detecting data anomalies, specifically for the shift in mean, outperforming conventional charts in this regard. Comparison among the three robust location estimators via simulations, namely Huber (H) and Biweight (B) estimators as well as the proposed Biweight estimator integrating the M-Scale (BM) estimator also demonstrate its superiority in handling shifting in mean process situations.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 2271-2097
Relation: https://www.itm-conferences.org/articles/itmconf/pdf/2024/10/itmconf_icmsa2024_01027.pdf; https://doaj.org/toc/2271-2097
DOI: 10.1051/itmconf/20246701027
Access URL: https://doaj.org/article/b2774890206a4345b859a2b85e7d0b7c
Accession Number: edsdoj.b2774890206a4345b859a2b85e7d0b7c
Database: Directory of Open Access Journals
More Details
ISSN:22712097
DOI:10.1051/itmconf/20246701027
Published in:ITM Web of Conferences
Language:English