darfix – data analysis for dark-field X-ray microscopy

Bibliographic Details
Title: darfix – data analysis for dark-field X-ray microscopy
Authors: Júlia Garriga Ferrer, Raquel Rodríguez-Lamas, Henri Payno, Wout De Nolf, Phil Cook, Vicente Armando Solé Jover, Can Yildirim, Carsten Detlefs
Source: Journal of Synchrotron Radiation, Vol 30, Iss 3, Pp 527-537 (2023)
Publisher Information: International Union of Crystallography, 2023.
Publication Year: 2023
Collection: LCC:Nuclear and particle physics. Atomic energy. Radioactivity
LCC:Crystallography
Subject Terms: x-ray optics, software, data analysis, Nuclear and particle physics. Atomic energy. Radioactivity, QC770-798, Crystallography, QD901-999
More Details: A Python package for the analysis of dark-field X-ray microscopy (DFXM) and rocking curve imaging (RCI) data is presented. DFXM is a non-destructive diffraction imaging technique that provides three-dimensional maps of lattice strain and orientation. The darfix package enables fast processing and visualization of these data, providing the user with the essential tools to extract information from the acquired images in a fast and intuitive manner. These data processing and visualization tools can be either imported as library components or accessed through a graphical user interface as an Orange add-on. In the latter case, the different analysis modules can be easily chained to define computational workflows. Operations on larger-than-memory image sets are supported through the implementation of online versions of the data processing algorithms, effectively trading performance for feasibility when the computing resources are limited. The software can automatically extract the relevant instrument angle settings from the input files' metadata. The currently available input file format is EDF and in future releases HDF5 will be incorporated.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 1600-5775
16005775
Relation: http://scripts.iucr.org/cgi-bin/paper?S1600577523001674; https://doaj.org/toc/1600-5775
DOI: 10.1107/S1600577523001674
Access URL: https://doaj.org/article/99a46ffadb1a4137ba5cecdaac42cff2
Accession Number: edsdoj.99a46ffadb1a4137ba5cecdaac42cff2
Database: Directory of Open Access Journals
More Details
ISSN:16005775
DOI:10.1107/S1600577523001674
Published in:Journal of Synchrotron Radiation
Language:English