Ellipsometry Characterisation for the Cd1-xZnxTe1-ySey Semiconductor Used in X-ray and Gamma Radiation Detectors

Bibliographic Details
Title:	Ellipsometry Characterisation for the Cd1-xZnxTe1-ySey Semiconductor Used in X-ray and Gamma Radiation Detectors
Authors:	Lidia Martínez Herraiz, Jose Luis Plaza Canga-argüelles, Alejandro Francisco Braña de Cal
Source:	Crystals, Vol 13, Iss 4, p 693 (2023)
Publisher Information:	MDPI AG, 2023.
Publication Year:	2023
Collection:	LCC:Crystallography
Subject Terms:	crystal composition, surface composition, optical models, characterisation, alloys, semiconducting II-VI materials, Crystallography, QD901-999
More Details:	The study of the optical properties of the Cd1-xZnxTe1-ySey (CZTS) crystal provides a clear idea about its response to incident X-ray or gamma radiation. This is important for selecting a proper composition of CZTS to achieve superior quality and high-resolution X-ray and gamma radiation detectors at room temperature and reduce their production cost. This article’s novelty is in lowering the cost of the optical and compositional characterisation of CZTS using the ellipsometry technique. The most significant successes achieved are the composition ellipsometry model determination of CZTS based on the Effective Medium Approximation (EMA) substrate of the binary compound CdTe and ZnSe with an oxide layer of CdTe and the experimental verification that the bandgap moves to lower energies with the addition of Se.
Document Type:	article
File Description:	electronic resource
Language:	English
ISSN:	13040693 2073-4352
Relation:	https://www.mdpi.com/2073-4352/13/4/693; https://doaj.org/toc/2073-4352
DOI:	10.3390/cryst13040693
Access URL:	https://doaj.org/article/96b9a4a345f34bd8bbe0bce66e2525d1
Accession Number:	edsdoj.96b9a4a345f34bd8bbe0bce66e2525d1
Database:	Directory of Open Access Journals
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More Details
ISSN:	13040693 20734352
DOI:	10.3390/cryst13040693
Published in:	Crystals
Language:	English