Response of 4H-SiC Detectors to Ionizing Particles

Bibliographic Details
Title: Response of 4H-SiC Detectors to Ionizing Particles
Authors: Robert Bernat, Ivana Capan, Luka Bakrač, Tomislav Brodar, Takahiro Makino, Takeshi Ohshima, Željko Pastuović, Adam Sarbutt
Source: Crystals, Vol 11, Iss 1, p 10 (2020)
Publisher Information: MDPI AG, 2020.
Publication Year: 2020
Collection: LCC:Crystallography
Subject Terms: silicon carbide, radiation detector, radiation response, alpha particles, gamma radiation, Crystallography, QD901-999
More Details: We report the response of newly designed 4H-SiC Schottky barrier diode (SBD) detector prototype to alpha and gamma radiation. We studied detectors of three different active area sizes (1 × 1, 2 × 2 and 3 × 3 mm2), while all detectors had the same 4H-SiC epi-layer thickness of approximately µm, sufficient to stop alpha particles up to 6.8 MeV, which have been used in this study. The detector response to the various alpha emitters in the 3.27 MeV to 8.79 MeV energy range clearly demonstrates the excellent linear response to alpha emissions of the detectors with the increasing active area. The detector response in gamma radiation field of Co-60 and Cs-137 sources showed a linear response to air kerma and to different air kerma rates as well, up to 4.49 Gy/h. The detector response is not in saturation for the dose rates lower than 15.3 mGy/min and that its measuring range for gamma radiation with energies of 662 keV, 1.17 MeV and 1.33 MeV is from 0.5 mGy/h–917 mGy/h. No changes to electrical properties of pristine and tested 4H-SiC SBD detectors, supported by a negligible change in carbon vacancy defect density and no creation of other deep levels, demonstrates the radiation hardness of these 4H-SiC detectors.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 11010010
2073-4352
Relation: https://www.mdpi.com/2073-4352/11/1/10; https://doaj.org/toc/2073-4352
DOI: 10.3390/cryst11010010
Access URL: https://doaj.org/article/74f635f5a6f24749b509f65d8d38eab7
Accession Number: edsdoj.74f635f5a6f24749b509f65d8d38eab7
Database: Directory of Open Access Journals
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More Details
ISSN:11010010
20734352
DOI:10.3390/cryst11010010
Published in:Crystals
Language:English