Development of a high-energy-resolution EDXRD system with a CdTe detector for security inspection

Bibliographic Details
Title: Development of a high-energy-resolution EDXRD system with a CdTe detector for security inspection
Authors: Yifan Chen, Xin Wang, Qinghua Song, Jie Xu, Baozhong Mu
Source: AIP Advances, Vol 8, Iss 10, Pp 105113-105113-9 (2018)
Publisher Information: AIP Publishing LLC, 2018.
Publication Year: 2018
Collection: LCC:Physics
Subject Terms: Physics, QC1-999
More Details: Energy dispersive X-ray diffraction (EDXRD) has great potential for application in the field of security inspection. On the basis of the Bragg’s diffraction law, an EDXRD system simulation model was established. Using this model, the effect of geometrical parameters on the energy resolution and collecting efficiency was calculated. Based on the analysis data, an optimized EDXRD system with high energy resolution and sensitivity was constructed. The experimental results demonstrated that the system’s energy resolution was approximately 5% with an integration time of 3 s. For concealed samples, more sampling time was needed because of the stronger signal attenuation; however, an effective spectrum could still be obtained in less than 10 s. The system can be used to identify hidden contraband accurately, especially in specific regions of interest detected by imaging technology.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 2158-3226
Relation: https://doaj.org/toc/2158-3226
DOI: 10.1063/1.5052027
Access URL: https://doaj.org/article/a402e0e762eb4823944dfdb26bff58af
Accession Number: edsdoj.402e0e762eb4823944dfdb26bff58af
Database: Directory of Open Access Journals
More Details
ISSN:21583226
DOI:10.1063/1.5052027
Published in:AIP Advances
Language:English